Nano Devices and Materials |
Nano Devices and Materials |
開講部 | 大学院理工学研究科 修士課程 |
開講学科 | 電気電子情報工学専攻 |
開講学年 | 1年次 |
開講時期 | 後期 |
単位数 | 2 |
単位区分 | 特修 |
系列区分 | 特論 |
講義区分 | 講義 |
教授 | 上野和良 |
1. | Course guidance |
2. | Review of advanced interconnect technology for large scale integrated circuit |
3. | Interconnect material, copper grain growth, copper resistivity |
4. | Interconnect metallization process(1) copper electroplating |
5. | Interconnect metallization process(2) electroless processes |
6. | Barrier metals and their processes |
7. | Interconnect reliability, electromigration, stress-induced voiding, time-dependent dielectric breakdown |
8. | Reliability enhancement processes, electroless metal capping, copper alloy |
9. | Nanocarbon, carbon nano-tube, graphen, and their application to interconnects |
10. | Optical interconnects, Ge photodetector, nano-photonics, surface plasmon anntena |