Course title
7M9600001
Advanced Characterization of Materials

 anjela dimitrova koblischka veneva
Course content
The engineering of new types of materials requires are profound knowledge of the microstructure. Modern materials consist of complex structures (grains in the nanometer range, composite materials, hybrid materials) which demand high-resolution analysis to be carried out. Therefore, employing advanced characterization techniques is essential for the understanding of the respective microstructure to improve the material properties and the design of new materials. This class will describe the basics of several material characterization techniques (x-ray techniques, electron microscopy, atom/ion microscopy, electron diffraction, atom-probe tomography and 3D-imaging), including a thorough discussion of the roads to prepare sample surfaces for studies using the advanced microscopes. The state-of-the-art of the science of materialography will be discussed in detail.
Purpose of class
The students will learn the basic physics of the advanced material characterization techniques using electron or ion beams, and can follow the recent developments in this field towards the 3D imaging. Furthermore, the basic principles of materialography will be outlined to teach the students to effectively prepare samples for advanced characterization.
Goals and objectives
  1. To understand the purpose of material characterization.
  2. To understand the basic physics of the advanced material characterization techniques using electron or ion beams
  3. To understand the basic principles of materialography and to be able effectively to prepare samples for advanced characterization
  4. To be able to show a knowledge of the capabilities and limitations of the different types of analysis introduced in the course
  5. To be able to make educated decisions regarding the selection of appropriate characterization methods for a particular research problem
Language
English
Class schedule

 Class schedule HW assignments (Including preparation and review of the class.) Amount of Time Required
1． Introduction to the course: Relevance of advanced characterization to materials development, scientific understanding of phenomena in materials technology Check the syllabus carefully 100minutes
2． X-ray diffraction analysis (XRD); Introduction to X-Ray Powder Diffraction Data Analysis; Applications of XRD Review of the lecture 100minutes
3． Electron microscopy:
Principle and application of Scanning Electron Microscopy (SEM);
Field Emission - Scanning Electron Microscope (FE-SEM); 		Review of the lecture 100minutes
4．
Transmission Electron Microscopy (TEM);
Chemical analysis by X-ray analysis in electron microscopes (EDS and WDS) 		Review of the lecture 100minutes
5． Atom/ion microscopy: Principle and application of Helium Ion Microscopy (HIM) Review of the lecture 100minutes
6． Focused Ion Beam (FIB) Review of the lecture 100minutes
7． Surface preparation techniques: basic methods of materialographic preparation Review of the lecture 100minutes
8． Observation and evaluation of the microstructure (imaging techniques: optical microscopy; SEM, TEM) of metallic and ceramic materials or composites Review of the lecture 100minutes
9． Electron Backscatter Diffraction (EBSD)/Orientation Imaging Microscopy (OIM) - measuring crystallographic orientations in the SEM; Review of the lecture 100minutes
10． OIM and X-ray texture analysis Review of the lecture 100minutes
11． Application of OIM: practical exercise (FE-SEM JEOL; EBSD-TSL;TechnoPlaza;Toyosu Campus) Review of the lecture 100minutes
12． Introduction to OIM data collection and OIM data analysis software. Review of the lecture 100minutes
13． Atom Probe Tomography (APT) - atomic resolution analysis; 3D-imaging techniques and instrumentation Review of the lecture 100minutes
14． Final presentation Review acquired knowledge 100minutes
Total. - - 1400minutes
Relationship between 'Goals and Objectives' and 'Course Outcomes'

 Attendance Discussion during lecture Final presentation Total.
1. 30% 20% 50% 100%
2. 0%
3. 0%
Total. 30% 20% 50% -
Evaluation method and criteria
Attendance and the discussion during the lecture on some topics regarding X-ray diffraction analysis, OIM- and X-ray texture analysis and the final presentation will be evaluated.
Textbooks and reference materials
Suitable scientific and technological textbooks will be used during the course. Some scientific papers will be handed out.
Prerequisites
Prerequisites
No
Office hours and How to contact professors for questions
  • - e-mail: anjela@shibaura-it.ac.jp
    - Thursday, 14:00-16:15, Research Building, room R31, 4-th floor
Relation to the environment
Non-environment-related course
Regionally-oriented
Non-regionally-oriented course
Development of social and professional independence
  • Course that cultivates an ability for utilizing knowledge
  • Course that cultivates a basic problem-solving skills
  • Course that cultivates a basic self-management skills
Active-learning course
About half of the classes are interactive
Course by professor with work experience
Work experience Work experience and relevance to the course content if applicatable
N/A N/A
Last modified : Wed Oct 02 04:02:21 JST 2019