The engineering of new types of materials requires are profound knowledge of the microstructure. Modern materials consist
of complex structures (grains in the nanometer range, composite materials, hybrid materials) which demand high-resolution
analysis to be carried out. Therefore, employing advanced characterization techniques is essential for the understanding of
the respective microstructure to improve the material properties and the design of new materials. This class will describe
the basics of several materials characterization techniques (x-ray techniques, electron microscopy, atom/ion microscopy, electron
diffraction, atom-probe tomography and 3D-imaging), including a thorough discussion of the roads to prepare sample surfaces
for studies using the advanced microscopes. The state-of-the-art of the science of materialography will be discussed in detail.
The students will learn the basic physics of the advanced material characterization techniques using electron or ion beams,
and can follow the recent developments in this field towards the 3D imaging. Furthermore, the basic principles of materialography
will be outlined to teach the students to effectively prepare samples for advanced characterization.
- The students will be able to understand the purpose of material characterization.
- The students will be able to understand the basic physics of the advanced materials characterization techniques using electron or ion beams.
- The students will be able to understand the basic principles of materialography and will be able effectively to prepare samples for advanced characterization.
- The students will be able to show a knowledge of the capabilities and limitations of the different types of analysis introduced in the course.
- The students will be able to make educated decisions regarding the selection of appropriate characterization methods for a particular research problem.
| Class schedule | HW assignments (Including preparation and review of the class.) | Amount of Time Required | |
|---|---|---|---|
| 1． | Introduction to the course: Relevance of advanced characterization to materials development; Scientific understanding of phenomena in materials technology |
Check the syllabus carefully | 130minutes |
| 2． | X-ray diffraction analysis (XRD); Introduction to X-Ray Powder Diffraction Data Analysis; Applications of XRD |
Review of the lecture | 130minutes |
| 3． | Electron microscopy: Principle and application of Scanning Electron Microscopy (SEM); Field Emission - Scanning Electron Microscope (FE-SEM); Chemical analysis by X-ray analysis in electron microscopes (EDS and WDS) |
Review of the lecture | 130minutes |
| 4． | Transmission Electron Microscopy (TEM): Principle and application of TEM |
Review of the lecture | 130minutes |
| Report preparation | 180minutes | ||
| 5． | Atom/ion microscopy: Principle and application of Helium Ion Microscopy (HIM) |
Review of the lecture | 130minutes |
| 6． | Focused Ion Beam (FIB): Principle and application of FIB |
Review of the lecture | 130minutes |
| Report preparation | 180minutes | ||
| 7． | Surface preparation techniques: Basic methods of materialographic preparation |
Review of the lecture | 130minutes |
| 8． | Observation and evaluation of the microstructure Iimaging techniques: Optical microscopy (OM); SEM, TEM of metallic and ceramic materials or composites |
Review of the lecture | 130minutes |
| Report preparation | 180minutes | ||
| 9． | Electron Backscatter Diffraction (EBSD)/Orientation Imaging Microscopy (OIM) - measuring crystallographic orientations in the SEM | Review of the lecture | 130minutes |
| 10． | Introduction to OIM data collection and OIM data analysis software | Review of the lecture | 130minutes |
| Report preparation | 180minutes | ||
| 11． | OIM and X-ray texture analysis | Review of the lecture | 130minutes |
| 12． | Application of OIM to different materials | Review of the lecture | 130minutes |
| Report preparation | 180minutes | ||
| 13． | Atom Probe Tomography (APT): Atomic resolution analysis; 3D-imaging techniques and instrumentation |
Review of the lecture | 130minutes |
| 14． | Final presentation | Presentation preparation | 200minutes |
| Total. | - | - | 2790minutes |
| Discussion during lecture | Report | Final presentation | Total. | |
|---|---|---|---|---|
| 1. | 3% | 10% | 10% | 23% |
| 2. | 3% | 5% | 10% | 18% |
| 3. | 3% | 5% | 10% | 18% |
| 4. | 3% | 5% | 10% | 18% |
| 5. | 3% | 5% | 15% | 23% |
| Total. | 15% | 30% | 55% | - |
Evaluation will be performed on the basis of discussions during the lecture, reports and final presentation.
Discussion during the lecture will contribute 15% to your grade.
Report will contribute 30% to your grade.
Final presentation will contribute 55% to your grade.
To pass the student must earn a total score of 60% or more.
1.Materials Characterization Techniques, bySam Zhang, Lin Li, Ashok Kumar;
CRC Press, Published December 22, 2008; ISBN 9781420042948
2. R. F. Egerton, Physical Principles of Electron Microscopy, Springer 2016, ISBN 978-3-319-39876-1
3. P. W. Hawkes, J.C.H. Spence, Science of Microscopy, Springer 2007, ISBN 978-0-387-25296-4
4. Scientific materials (publications), related to the lecture will be used as references
CRC Press, Published December 22, 2008; ISBN 9781420042948
2. R. F. Egerton, Physical Principles of Electron Microscopy, Springer 2016, ISBN 978-3-319-39876-1
3. P. W. Hawkes, J.C.H. Spence, Science of Microscopy, Springer 2007, ISBN 978-0-387-25296-4
4. Scientific materials (publications), related to the lecture will be used as references
- Contact via e-mail: anjela@shibaura-it.ac.jp
- Course that cultivates an ability for utilizing knowledge
- Course that cultivates a basic problem-solving skills
- Course that cultivates a basic self-management skills
| Work experience | Work experience and relevance to the course content if applicatable |
|---|---|
| N/A | N/A |
- 4.QUALITY EDUCATION
- 5.GENDER EQUALITY
- 9.INDUSTRY, INNOVATION AND INFRASTRUCTURE
Last modified : Tue Sep 01 04:24:54 JST 2020