Course title
Advanced Characterization of Materials

anjela dimitrova koblischka veneva
Course content
The engineering of new types of materials requires are profound knowledge of the microstructure. Modern materials consist of complex structures (grains in the nanometer range, composite materials, hybrid materials) which demand high-resolution analysis to be carried out. Therefore, employing advanced characterization techniques is essential for the understanding of the respective microstructure to improve the material properties and the design of new materials. This class will describe the basics of several material characterization techniques (x-ray techniques, electron microscopy, atom/ion microscopy, electron diffraction, atom-probe tomography and 3D-imaging), including a thorough discussion of the roads to prepare sample surfaces for studies using the advanced microscopes. The state-of-the-art of the science of materialography will be discussed in detail.
Purpose of class
The students will learn the basic physics of the advanced material characterization techniques using electron or ion beams, and can follow the recent developments in this field towards the 3D imaging. Furthermore, the basic principles of materialography will be outlined to teach the students to effectively prepare samples for advanced characterization.
Goals and objectives
  1. To understand the purpose of material characterization.
  2. To understand the basic physics of the advanced material characterization techniques using electron or ion beams
  3. To understand the basic principles of materialography and to be able effectively to prepare samples for advanced characterization
  4. To be able to show a knowledge of the capabilities and limitations of the different types of analysis introduced in the course
  5. To be able to make educated decisions regarding the selection of appropriate characterization methods for a particular research problem
Class schedule

Class schedule HW assignments (Including preparation and review of the class.) Amount of Time Required
1. Introduction to the course:
Relevance of advanced characterization to materials development;
Scientific understanding of phenomena in materials technology
Check the syllabus carefully 200minutes
2. X-ray diffraction analysis (XRD);
Introduction to X-Ray Powder Diffraction Data Analysis; Applications of XRD
Review of the lecture 190minutes
3. Electron microscopy:
Principle and application of Scanning Electron Microscopy (SEM);
Field Emission - Scanning Electron Microscope (FE-SEM);
Chemical analysis by X-ray analysis in electron microscopes (EDS and WDS)
Review of the lecture 190minutes
4. Transmission Electron Microscopy (TEM):
Principle and application of TEM
Review of the lecture 190minutes
5. Atom/ion microscopy:
Principle and application of Helium Ion Microscopy (HIM)
Review of the lecture 190minutes
6. Focused Ion Beam (FIB):
Principle and application of FIB
Review of the lecture 190minutes
7. Surface preparation techniques:
Basic methods of materialographic preparation
Review of the lecture 190minutes
8. Observation and evaluation of the microstructure
Iimaging techniques:
Optical microscopy (OM); SEM, TEM of metallic and ceramic materials or composites
Review of the lecture 190minutes
9. Electron Backscatter Diffraction (EBSD)/Orientation Imaging Microscopy (OIM) - measuring crystallographic orientations in the SEM; Review of the lecture 190minutes
10. OIM and X-ray texture analysis Review of the lecture 190minutes
11. Application of OIM: practical exercise (FE-SEM JEOL; EBSD-TSL;TechnoPlaza;Toyosu Campus) Review of the lecture 190minutes
12. Introduction to OIM data collection and OIM data analysis software. Review of the lecture 190minutes
13. Atom Probe Tomography (APT):
Atomic resolution analysis;
3D-imaging techniques and instrumentation
Review of the lecture 190minutes
14. Final presentation Review acquired knowledge 200minutes
Total. - - 2680minutes
Relationship between 'Goals and Objectives' and 'Course Outcomes'

Attendance Discussion during lecture Final presentation Total.
1. 30% 20% 50% 100%
2. 0%
3. 0%
Total. 30% 20% 50% -
Evaluation method and criteria
Attendance and the discussion during the lecture on some topics regarding X-ray diffraction analysis, OIM- and X-ray texture analysis and the final presentation will be evaluated.
Evaluation will be performed on the basis of exam results, presentation and class attendance. More than 60% of the total score is needed for getting the course credit.
Textbooks and reference materials
1.Materials Characterization Techniques, bySam Zhang, Lin Li, Ashok Kumar;
CRC Press, Published December 22, 2008; ISBN 9781420042948

2. R. F. Egerton, Physical Principles of Electron Microscopy, Springer 2016, ISBN 978-3-319-39876-1

3. P. W. Hawkes, J.C.H. Spence, Science of Microscopy, Springer 2007, ISBN 978-0-387-25296-4

4. Scientific materials (publications), related to the lecture will be used as references
Office hours and How to contact professors for questions
  • - e-mail:
    - Thursday, 14:00-16:15, Research Building, room R31, 4-th floor
Non-regionally-oriented course
Development of social and professional independence
  • Course that cultivates an ability for utilizing knowledge
  • Course that cultivates a basic problem-solving skills
  • Course that cultivates a basic self-management skills
Active-learning course
About half of the classes are interactive
Course by professor with work experience
Work experience Work experience and relevance to the course content if applicatable
Education related SDGs:the Sustainable Development Goals
Last modified : Thu Apr 16 04:03:34 JST 2020