The zoo of scanning probe techniques

Course title

7M990300

Course content

In this lecture, we will discuss the “zoo” of scanning probe techniques (SXM) which was developed after the Nobel prize for Binnig and Rohrer in 1986.
Starting from the history and details of the very first scanning tunneling microscope (STM), we discuss the present-day configuration of a modern STM, and the following development of the first force microscope (AFM). Then, the various approaches and developments are presented which make the AFM a very useful measurement technique for all types of samples, including such of biologic origin.
The important point are the various forces which can be measured if the cantilevers are equipped with a certain functionality. This comprises electric, magnetic and chemical forces, the realization of which has led to various techniques like EFM, MFM, KPFM, and many more. The standard MFM technique is limited to a resolution in the 10 nm range, so there is a strong demand to further improve the resolution. This led to another SPM technique, the spin-polarized (SP)-STM.
Another “big” issue in the ongoing research is the increase of the measurement speed, which is driven by demands from biology, but also from magnetic applications like magnetic hard disks. This will be discussed in this lecture as well.

Purpose of class

The students will learn the basics of the scanning probe techniques (SXM). Furthermore, the principles and operation of the scanning tunneling microscope (STM), atomic force microscope (AFM) will be discussed.
The students will learn how to interpret at the measured results. At the end of the course, students should be able to make educated decisions regarding the selection of appropriate characterization methods for a particular research problem.

Goals and objectives

The students will be able to understand the basic physics and principles of the scanning probe techniques (SXM)
The students will be able to show a knowledge of the capabilities and limitations of the different types of scanning probe techniques introduced
in the course
The students will be able to make educated decisions regarding the selection of appropriate characterization methods for a
particular research problem

Language

English

Class schedule

	Class schedule	HW assignments (Including preparation and review of the class.)	Amount of Time Required
1．	Introduction to the course Historical development, basic ideas	Review of the lecture	100minutes
1．		Read the handouts	100minutes
2．	Scanning tunneling microscope (STM): part I Basic theoretical framework Principles of operation	Review of the lecture	100minutes
2．		Read the handouts	100minutes
3．	Scanning tunneling microscope (STM): part II Instrumentation Applications	Review of the lecture	100minutes
3．		Read the handouts	100minutes
4．	Atomic-force microscopy (AFM): part I History and background of AFM How an Atomic Force Microscope works Basic components of an AFM	Review of the lecture	100minutes
4．		Read the handouts	100minutes
5．	Atomic-force microscopy (AFM): part II Tip-Sample interactions and feedback mechanism AFM imaging Atomic force and different scanning modes	Review of the lecture	100minutes
5．		Read the handouts	100minutes
6．	AFM: part III AFM tips and resolution Advanced imaging techniques of AFM	Review of the lecture	100minutes
6．		Read the handouts	100minutes
7．	Midterm presentation and discussion	Midterm Presentation	100minutes
7．	Midterm presentation and discussion		100minutes
8．	Other forces – electric, magnetic...	Review of the lecture	100minutes
8．	Other forces – electric, magnetic...	Read the handouts	100minutes
9．	Magnetic imaging to the atomic scale	Review of the lecture	100minutes
9．	Magnetic imaging to the atomic scale	Read the handouts	100minutes
10．	The issue of measurement speed	Review of the lecture	100minutes
10．	The issue of measurement speed	Read the handouts	100minutes
11．	High-frequency techniques: part I	Review of the lecture	100minutes
11．	High-frequency techniques: part I	Read the handouts	100minutes
12．	High-frequency techniques: part II	Review of the lecture	100minutes
12．	High-frequency techniques: part II	Read the handouts	100minutes
13．	High-frequency techniques: part III	Review of the lecture	100minutes
13．	High-frequency techniques: part III	Read the handouts	100minutes
14．	Final presentation	Presentation preparation	200minutes
Total.	-	-	2800minutes

Relationship between 'Goals and Objectives' and 'Course Outcomes'

	Midterm presentation	Final presentation	Total.
1.	15%	20%	35%
2.	10%	20%	30%
3.	15%	20%	35%
Total.	40%	60%	-

Evaluation method and criteria

Evaluation will be performed on the basis of discussions during the lecture, reports and final presentation.

Discussion during the lecture and reports will contribute 40% to your grade.
Final presentation will contribute 60% to your grade.

To pass the student must earn a total score of 60% or more.

Textbooks and reference materials

1. R. Wiesendanger, Scanning probe microscopy, Springer 1998

2. B. Voigtlaender, Scanning Probe Microscopy, Springer 2015

3. Scientific materials (publications), related to the lecture will be used as references

Prerequisites

Undergraduate level in physics and chemistry.

Office hours and How to contact professors for questions

Contact via e-mail: miko@shibaura-it.ac.jp

Regionally-oriented

Development of social and professional independence

Active-learning course

Course by professor with work experience

Work experience	Work experience and relevance to the course content if applicable
N/A	N/A

Education related SDGs:the Sustainable Development Goals

Last modified : Sun Mar 21 16:36:53 JST 2021