Course title
7M9800001
Materials Characterization Methods

 alicja klimkowicz Click to show questionnaire result at 2019
Course content
During this course, the student will learn about the basic measuring techniques used in material science. Possibilities and limitations of techniques will be introduced together with a description of when to use a particular measuring method. Microscopic, diffraction, resonance, and thermoanalytical techniques for materials testing will be introduced. A comparison of the possibilities of optical, scanning, and transmission electron microscopy will be given. Atomic force microscope, scanning tunneling microscopy will be explained. Basics of X-ray diffraction, electron and neutron diffraction will be given, followed by thermogravimetry, direct scanning calorimetry, and dilatometry. Measurements of electrical and transport properties such as electrical conductivity. The thermoelectric force will be explained. Resonance methods will also be described. The course will be complemented by a sample preparation discussion and data analysis. Occupational safety and health aspects will be underlined.
Purpose of class
The purpose of the class is to understand the scientific backgrounds of techniques used in materials characterization. The students are aware of the possibilities and limitations of the characterization methods. The students learn how to handle professional equipment. The students will learn how to interpret the measured results and learn what type of software can be used for data analysis. After taking the class, the students will be able to design a study plan for testing their materials by themselves.
Goals and objectives
  1. The students can choose an appropriate measuring technique suitable for the investigation of their samples.
  2. The students understand the principle, know the advantages and limitations of the described techniques.
  3. The students can analyze the results using appropriate software.
  4. The students can plan usage of the appropriate methods to evaluate their samples.
Language
English
Class schedule

 Class schedule HW assignments (Including preparation and review of the class.) Amount of Time Required
1． Diffraction methods, lecture: X-ray, electron, neutron diffraction, synchrotron light, part 1. review of the class 130minutes
2． Diffraction methods, lecture: X-ray, electron, neutron diffraction, synchrotron light, part 2. review of the class 130minutes
3． Diffraction technique, presentation of X-ray smart lab, X-ray ultima IV available in Technolpaza, Toyosu campus, part 1. review of the class 130minutes
4． Diffraction technique, presentation of X-ray smart lab, X-ray ultima IV available in Technolpaza, Toyosu campus, part 2. review of the class 130minutes
report preparation 220minutes
5． Microscopy, lecture: optical, scanning and transmission microscopy, atomic force microscope, scanning tunneling microscopy, part 1. review of the class 130minutes
6． Microscopy, lecture: optical, scanning and transmission microscopy, atomic force microscope, scanning tunneling microscopy, part 2. review of the class 130minutes
7． Microscopy: presentation on JEOL SEM7100F and JEOL SEM 7610F equipped with EDS detector, part 1. review of the class, 130minutes
8． Microscopy: presentation on JEOL SEM7100F and JEOL SEM 7610F equipped with EDS detector, part 2. review of the class 130minutes
report preparation 220minutes
9． Temperature related measurements, lecture: thermogravimetry (TG+DTA) and direct scanning calorimetry (DSC), dilatometry, part 1. review of the class 130minutes
10． Temperature related measurements, lecture: thermogravimetry (TG+DTA) and direct scanning calorimetry (DSC), dilatometry, part 2. review of the class 130minutes
11． Presentation of TG-DTA from BRUKER ASX TG 2020 and DSC, part 1. review of the class 130minutes
12． Presentation of TG-DTA from BRUKER ASX TG 2020 and DSC, part 2. review of the class 130minutes
report preparation 220minutes
13． Electrical and transport properties, lecture: electrical conductivity, thermoelectric force. Resonance testing methods. review of the class 130minutes
14． Students final presentation. presentation preparation 300minutes
Total. - - 2650minutes
Relationship between 'Goals and Objectives' and 'Course Outcomes'

 Report Final presentation Total.
1. 20% 5% 25%
2. 20% 5% 25%
3. 20% 5% 25%
4. 5% 20% 25%
Total. 65% 35% -
Evaluation method and criteria
The students will be evaluated based on their reports preparation and final presentation.
Those who get at least 60% of the full score will pass this course.
Textbooks and reference materials
Handouts from the teacher.
Supplementary textbooks:
Springer Handbook of Metrology and Testing Editors: Czichos, Horst, Saito, Tetsuya, Smith, Leslie E. (Eds.)
Diffraction Analysis of the Microstructure of Materials Editors Eric J. Mittemeijer, Paolo Scardi
Prerequisites
No
Office hours and How to contact professors for questions
  • Please schedule a meeting via email: alicja(at)shibaura-it.ac.jp
  • The office location: Research Building, room 04032
    Regular hours 9-18 Monday-Friday
Regionally-oriented
Development of social and professional independence
  • Course that cultivates an ability for utilizing knowledge
  • Course that cultivates a basic problem-solving skills
Active-learning course
About half of the classes are interactive
Course by professor with work experience
Work experience Work experience and relevance to the course content if applicable
N/A N/A
Education related SDGs:the Sustainable Development Goals
    Last modified : Sun Mar 21 15:17:08 JST 2021