This course provides a broad overview of essential material characterization techniques, focusing on both surface and bulk
analysis methods. Students will explore a variety of techniques.
The course is divided in two parts.
In the first part of the course, light microscopy, X-Ray diffraction, Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) will be introduced.
In the second part of the course, Electron spectroscopy, X-ray spectroscopy, Secondary Ion mass Spectroscopy (SIMS), Mossbauer Spectroscopy, Thermal Analysis, Electrical and magnetic characterizations, Mechanical properties, porosity, wettability and roughness of materials will be introduced.
The course emphasizes understanding the principles behind each technique, selecting appropriate techniques for different material types and research objectives.
The course is divided in two parts.
In the first part of the course, light microscopy, X-Ray diffraction, Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) will be introduced.
In the second part of the course, Electron spectroscopy, X-ray spectroscopy, Secondary Ion mass Spectroscopy (SIMS), Mossbauer Spectroscopy, Thermal Analysis, Electrical and magnetic characterizations, Mechanical properties, porosity, wettability and roughness of materials will be introduced.
The course emphasizes understanding the principles behind each technique, selecting appropriate techniques for different material types and research objectives.
The students will learn the foundational principles of widely used material characterization techniques. They will be instructed
to understand the differences between surface and bulk analysis methods and the implications of using destructive versus non-destructive
techniques. The course will guide students in making critical choices about which techniques are best suited for analyzing
specific materials, considering factors such as material type, research goals, and the nature of the data required. As it
is a requirement of a modern engineer, students will be prepared to apply these techniques in practical scenarios to solve
complex engineering problems.
| Goals and objectives | Course Outcomes | |
|---|---|---|
| 1. | Students will be able to classify the most common characterization techniques and discuss light microscopy and X-Ray diffraction |
A-1
|
| 2. | Students will be able to discuss Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) |
A-1
|
| 3. | Students will be able to discuss Electron spectroscopy, X-ray spectroscopy, Secondary Ion mass Spectroscopy (SIMS) and Mossbauer Spectroscopy |
A-1
|
| 4. | Students will be able to discuss Thermal Analysis, Electrical and magnetic characterizations, Mechanical properties, porosity, wettability and roughness of materials |
A-1
|
| 5. | Students will be able to prepare a report and delivery a presentation on a topic of their choice from the first part of the course |
A-1
|
| 6. | Students will be able to prepare a report and delivery a presentation on a topic of their choice from the second part of the course |
A-1
|
| Questionnaires (1-4) | reports (1, 2) | Presentations (1, 2) | Total. | |
|---|---|---|---|---|
| 1. | 10% | 10% | ||
| 2. | 10% | 10% | ||
| 3. | 10% | 10% | ||
| 4. | 10% | 10% | ||
| 5. | 15% | 15% | 30% | |
| 6. | 15% | 15% | 30% | |
| Total. | 40% | 30% | 30% | - |
| Class schedule | HW assignments (Including preparation and review of the class.) | Amount of Time Required | |
|---|---|---|---|
| 1. | Introduction: scope of the course; classification of techniques. Basic reminds of crystallography and solid state chemistry. |
read handouts of class | 150分 |
| 2. | Light Microscopy | read handouts of class | 150分 |
| 3. | X-Ray Diffraction | read handouts of class | 150分 |
| preparation for questionnaire #1 | 70分 | ||
| 4. | Scanning Electron Microscopy (SEM) | read handouts of class | 150分 |
| 5. | Transmission Electron Microscopy (TEM) | read handouts of class | 150分 |
| 6. | Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) | read handouts of class | 150分 |
| preparation for questionnaire #2 | 70分 | ||
| preparation of first report | 100分 | ||
| 7. | First exam in class (delivery of first presentation in front of colleagues) | preparation of first presentation | 170分 |
| 8. | Electron spectroscopy | read handouts of class | 150分 |
| 9. | : X-ray spectroscopy | read handouts of class | 150分 |
| preparation for questionnaire #3 | 70分 | ||
| 10. | Secondary Ion mass Spectroscopy (SIMS) and Mossbauer Spectroscopy | read handouts of class | 150分 |
| 11. | Thermal Analysis | read handouts of class | 150分 |
| 12. | Electrical and magnetic characterizations | read handouts of class | 180分 |
| 13. | Characterization of mechanical properties, porosity, wettability and roughness | read handouts of class | 150分 |
| preparation for questionnaire #4 | 70分 | ||
| Preparation of second report | 100分 | ||
| 14. | Second exam in class (delivery of second presentation in front of colleagues) | preparation of second presentation | 170分 |
| Total. | - | - | 2650分 |
| A:Fundamental Mechanical Engineering | B:Advanced Mechanical Engineering | C:Environment and Materials Engineering | D:Chemistry and Biotechnology | E:Electrical Engineering and Robotics | G:Advanced Electronic Engineering | F:Information and Communications Engineering | L:Computer Science and Engineering | H:Urban Infrastructure and Environment |
|---|
The students will be evaluated on the basis of:
- Periodical tests (4 questionnaires) to be replied at home. Each questionnaire will contribute 10% of student`s grade. Totally the questionnaires will contribute to 40% of the grade.
- First exam based on a report (15% of the grade) and a presentation in class (15% of the grade) on a topic of choice from the classes 1 -6. The first exam will contribute to 30% of student`s grade.
- Second exam based on a report (15% of the grade) and a presentation in class (15% of the grade) on a topic of choice from the classes 8-13. The second exam will contribute to 30% of student`s grade.
Those who get at least 60% of the full score will pass this course.
- Periodical tests (4 questionnaires) to be replied at home. Each questionnaire will contribute 10% of student`s grade. Totally the questionnaires will contribute to 40% of the grade.
- First exam based on a report (15% of the grade) and a presentation in class (15% of the grade) on a topic of choice from the classes 1 -6. The first exam will contribute to 30% of student`s grade.
- Second exam based on a report (15% of the grade) and a presentation in class (15% of the grade) on a topic of choice from the classes 8-13. The second exam will contribute to 30% of student`s grade.
Those who get at least 60% of the full score will pass this course.
| ways of feedback | specific contents about "Other" |
|---|---|
| Feedback in outside of the class (ScombZ, mail, etc.) |
No specific text. Handouts distributed in the classroom.
Supporting text is Yang Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Second Edition, Wiley 2013
Supporting text is Yang Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Second Edition, Wiley 2013
- Appointment to be fixed contacting the teacher. Substitute "[at]" with "@"
- Contact e-mail addresses to Paolo Mele: pmele[at]shibaura-it.ac.jp
- Course that cultivates an ability for utilizing knowledge
- Course that cultivates a basic problem-solving skills
| Work experience | Work experience and relevance to the course content if applicable |
|---|---|
| N/A | N/A |
- 7.AFFORDABLE AND CLEAN ENERGY
- 11.SUSTAINABLE CITIES AND COMMUNITIES
- 12.RESPONSIBLE CONSUMPTION & PRODUCTION
Last modified : Mon Feb 10 04:06:19 JST 2025