This course will cover the basic methods of materialographic preparation of metallic and ceramic samples. All classical methods
for preparing flat surfaces (polishing) of different materials will be discussed. We will outline the routes for observation
and evaluation of the various microstructures. The newest trends in the methods and techniques of metallographic preparation
will be introduced. For this purpose, we will discuss various imaging techniques including optical, scanning, transmission
electron, scanning tunneling and field-ion microscopy of metallic and ceramic materials or composites and the relation assessment
among the structures, the mechanical and the physical properties. In addition, the students will be introduced to the process
of evaluation of material structures with current standards and will apply their knowledge to practical examples in the laboratory.
The students will obtain knowledge of the newest trends in the methods and techniques of metallographic preparation. The
students will learn all steps required to prepare sample surfaces and to the process of evaluation of material structures
with current standards and to apply their knowledge to practical examples in the laboratory.
The students will be able to learn to evaluate and understand the microstructural results of various imaging techniques - to perform quantitative image analysis and documentation of microstructures.
The students will be able to learn to evaluate and understand the microstructural results of various imaging techniques - to perform quantitative image analysis and documentation of microstructures.
| Goals and objectives | Course Outcomes | |
|---|---|---|
| 1. | The students will learn the required steps and processes to prepare sample surfaces for various characterization techniques |
A-1
|
| 2. | The students will be able to learn to evaluate the various material structures |
A-1
|
| 3. | The students will understand the features of the common material characterization techniques |
A-1
|
| 4. | The students will be able to learn Quantitative image analysis methods and documentation of microstructures |
A-1
|
| Class schedule | HW assignments (Including preparation and review of the class.) | Amount of Time Required | |
|---|---|---|---|
| 1. | Introduction and overview of sample surface preparation, examples of various microstructures | Review of the lecture | 100分 |
| Read the handouts | 90分 | ||
| 2. | Macrostructure vs. microstructure How to select samples for further investigations |
Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 3. | Step 1: Cutting and embedding of samples | Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 4. | Step 2: Grinding procedures | Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 5. | Step 3: Polishing procedures | Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 6. | Step 4: Sample etching | Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 7. | Midterm exam and discussion on the solutions | Preparation for midterm exam | 180分 |
| 8. | Step 5: Final treatments for high surface quality | Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 9. | Optical microscopy for materials characterization: Requirements and examples | Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 10. | Electron microscopy for materials characterization I: scanning electron microscopy (SEM) |
Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 11. | Electron microscopy for materials characterization II: transmission electron microscopy (TEM) |
Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 12. | Evaluation of microstructures I: Defects introduced in the surface preparation |
Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 13. | Evaluation of microstructures II: Defects in the samples |
Review of the lecture | 100分 |
| Read the handouts | 100分 | ||
| 14. | Final exam and discussion on the solutions | Preparation for final exam | 180分 |
| Total. | - | - | 2750分 |
| midterm exam | final exam | Total. | |
|---|---|---|---|
| 1. | 10% | 10% | 20% |
| 2. | 10% | 10% | 20% |
| 3. | 10% | 20% | 30% |
| 4. | 10% | 20% | 30% |
| Total. | 40% | 60% | - |
The students will be evaluated based on their midterm exam, activity during the class (presentation and discussion) will
contribute 40% of the grade and final exam will contribute 60% of the grade.
Students need at least 60% of the full score to pass this course.
Students need at least 60% of the full score to pass this course.
1.Metallographic and Materialographic Specimen Preparation, Light Microscopy, Image Analysis and Hardness Testing, by Kay
Geels;
ASTM stock number: MNL 46; ISBN 978-0-8031-4265-7; E-book ISBN 978-0-8031-5691-3
2. M. Sardela, Practical Materials Characterization, Springer 2014, ISBN: 978-1-4614-9280-1
3. D. Brandon, W. D. Kaplan, Microstructural Characterization of Materials, Wiley 2008, ISBN: 978-0-470-02785-1
4. G.F. vander Voort , Metallography, ASM International 2007, ISBN: 978-0-87170-672-0
ASTM stock number: MNL 46; ISBN 978-0-8031-4265-7; E-book ISBN 978-0-8031-5691-3
2. M. Sardela, Practical Materials Characterization, Springer 2014, ISBN: 978-1-4614-9280-1
3. D. Brandon, W. D. Kaplan, Microstructural Characterization of Materials, Wiley 2008, ISBN: 978-0-470-02785-1
4. G.F. vander Voort , Metallography, ASM International 2007, ISBN: 978-0-87170-672-0
- Contact via E-mail address: zxiaobin@shibaura-it.ac.jp
- Course that cultivates an ability for utilizing knowledge
- Course that cultivates a basic problem-solving skills
| Work experience | Work experience and relevance to the course content if applicable |
|---|---|
| N/A | N/A |
- 4.QUALITY EDUCATION
- 9.INDUSTRY, INNOVATION AND INFRASTRUCTURE
Last modified : Fri May 27 04:14:00 JST 2022