| Program / Major | mDP | Goals |
|---|---|---|
| 先進国際課程 | A-1 | A-1 Students shall obtain basic and advanced knowledge and skills in mathematics, natural and computer sciences as well as presentation skills to communicate on their knowledge with scholars from various fields. |
| (改組前)先進国際課程 | A-1 | A-1 Students shall obtain basic and advanced knowledge and skills in mathematics, natural and computer sciences as well as presentation skills to communicate on their knowledge with scholars from various fields. |
The students will learn the foundational principles of widely used material characterization techniques. They will be instructed
to understand the differences between surface and bulk analysis methods and the implications of using destructive versus non-destructive
techniques. The course will guide students in making critical choices about which techniques are best suited for analyzing
specific materials, considering factors such as material type, research goals, and the nature of the data required. As it
is a requirement of a modern engineer, students will be prepared to apply these techniques in practical scenarios to solve
complex engineering problems.
This course provides a broad overview of essential material characterization techniques, focusing on both surface and bulk
analysis methods. Students will explore a variety of techniques.
The course is divided in two parts.
In the first part of the course, light microscopy, X-Ray diffraction, Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and focused Ion Beam (FIB) will be introduced.
In the second part of the course, Scanning probe microscopy (SPM), Scanning Tunneling Microscopy (STM), Atomic force microscopy (AFM), Thermal Analysis, Electrical characterizations, Electron spectroscopy, X-ray spectroscopy, and application of all the considered techniques to thin films will be introduced.
The course emphasizes understanding the principles behind each technique, selecting appropriate techniques for different material types and research objectives.
The course is divided in two parts.
In the first part of the course, light microscopy, X-Ray diffraction, Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and focused Ion Beam (FIB) will be introduced.
In the second part of the course, Scanning probe microscopy (SPM), Scanning Tunneling Microscopy (STM), Atomic force microscopy (AFM), Thermal Analysis, Electrical characterizations, Electron spectroscopy, X-ray spectroscopy, and application of all the considered techniques to thin films will be introduced.
The course emphasizes understanding the principles behind each technique, selecting appropriate techniques for different material types and research objectives.
- Students will be able to classify the most common characterization techniques and discuss light microscopy and X-Ray diffraction
- Students will be able to discuss Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Scanning Probe Microscopy (SPM) and focused Ion Beam (FIB)
- Students will be able to discuss Scanning probe microscopy (SPM), Scanning Tunneling Microscopy (STM), Atomic force microscopy (AFM), Thermal Analysis, and Electrical characterizations
- Students will be able to discuss lectron spectroscopy, X-ray spectroscopy, and application of all the considered techniques to thin films
- Students will be able to prepare a report and delivery a presentation on a topic of their choice from the first part of the course
- Students will be able to prepare a report and delivery a presentation on a topic of their choice from the second part of the course
| Questionnaires (1-4) | reports (1, 2) | Presentations (1, 2) | Total. | |
|---|---|---|---|---|
| 1. | 10% | 10% | ||
| 2. | 10% | 10% | ||
| 3. | 10% | 10% | ||
| 4. | 10% | 10% | ||
| 5. | 15% | 15% | 30% | |
| 6. | 15% | 15% | 30% | |
| Total. | 40% | 30% | 30% | - |
The students will be evaluated on the basis of:
- Periodical tests (4 questionnaires) to be replied at home. Each questionnaire will contribute 10% of student`s grade. Totally the questionnaires will contribute to 40% of the grade.
- First exam based on a report (15% of the grade) and a presentation in class (15% of the grade) on a topic of choice from the classes 1 -6. The first exam will contribute to 30% of student`s grade.
- Second exam based on a report (15% of the grade) and a presentation in class (15% of the grade) on a topic of choice from the classes 8-13. The second exam will contribute to 30% of student`s grade.
Those who get at least 60% of the full score will pass this course.
- Periodical tests (4 questionnaires) to be replied at home. Each questionnaire will contribute 10% of student`s grade. Totally the questionnaires will contribute to 40% of the grade.
- First exam based on a report (15% of the grade) and a presentation in class (15% of the grade) on a topic of choice from the classes 1 -6. The first exam will contribute to 30% of student`s grade.
- Second exam based on a report (15% of the grade) and a presentation in class (15% of the grade) on a topic of choice from the classes 8-13. The second exam will contribute to 30% of student`s grade.
Those who get at least 60% of the full score will pass this course.
| Class schedule | HW assignments (Including preparation and review of the class.) | Amount of Time Required | |
|---|---|---|---|
| 1. | Introduction: scope of the course; classification of techniques. Basic reminds of crystallography and solid state chemistry. |
read handouts of class | 150minutes |
| 2. | Light Microscopy | read handouts of class | 150minutes |
| 3. | X-Ray Diffraction | read handouts of class | 150minutes |
| preparation for questionnaire #1 | 70minutes | ||
| 4. | Scanning Electron Microscopy (SEM) | read handouts of class | 150minutes |
| 5. | Transmission Electron Microscopy (TEM) | read handouts of class | 150minutes |
| 6. | focused ion beam (FIB) | read handouts of class | 150minutes |
| preparation for questionnaire #2 | 70minutes | ||
| preparation of first report | 100minutes | ||
| 7. | First exam in class (delivery of first presentation in front of colleagues) | preparation of first presentation | 170minutes |
| 8. | Scanning Probe Microscopy (SPM), Scanning Tunneling microscopy (STM) and Atomic Force Microscopy (AFM) | read handouts of class | 150minutes |
| 9. | Thermal Analysis | read handouts of class | 150minutes |
| preparation for questionnaire #3 | 70minutes | ||
| 10. | Electrical characterizations | read handouts of class | 150minutes |
| 11. | Electron spectroscopy | read handouts of class | 150minutes |
| 12. | X-ray spectroscopy | read handouts of class | 180minutes |
| 13. | Thin Films: Preparation Methods and Application of Characterization Techniques | read handouts of class | 150minutes |
| preparation for questionnaire #4 | 70minutes | ||
| Preparation of second report | 100minutes | ||
| 14. | Second exam in class (delivery of second presentation in front of colleagues) | preparation of second presentation | 170minutes |
| Total. | - | - | 2650minutes |
| ways of feedback | specific contents about "Other" |
|---|---|
| Feedback outside of the class (ScombZ, mail, etc.) |
No specific text. Handouts distributed in the classroom.
Supporting text is Yang Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Second Edition, Wiley 2013
Supporting text is Yang Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Second Edition, Wiley 2013
- Appointment to be fixed contacting the teacher. Substitute ”[at]” with ”@”
- Contact e-mail addresses to Paolo Mele: pmele[at]shibaura-it.ac.jp
- Course that cultivates an ability for utilizing knowledge
- Course that cultivates a basic problem-solving skills
| Work experience | Work experience and relevance to the course content if applicable |
|---|---|
| N/A | N/A |
- 7.AFFORDABLE AND CLEAN ENERGY
- 11.SUSTAINABLE CITIES AND COMMUNITIES
- 12.RESPONSIBLE CONSUMPTION & PRODUCTION
Last modified : Sat Mar 14 13:33:20 JST 2026